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ACTIVE TECHNOLOGIES

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RIFLE-SE

주요 스펙

Data bus
  • :8 / 16 / 32 bit (400MHz sample rate)
Vector Generator
  • :32 bit @ 400 MHz (2.5 ns edge resolution)
Address Generator
  • :32 bit @ 200 MHz (4x4)
Clock Generator
  • :400 MHz (1.25 ns edge resolution)
Waveform Generator
  • :

Non Volatile Memory Testers

Active Technologies RIFLE and RIFLE-SE Non Volatile Memory Testers have been adopted by the world leader memory manufactures, because their dedicated high performance measurement engine combined with their easy-to-use and easy-to-program, lead to success for the testing of single cell, stand alone or embedded avant-garde non volatile memories(NAND/NOR standard flash, multilevel, dual bit, PCM).

Based on the great success of the RIFLE test equipment about the greatest European memory manufacturers (Infineon Flash, ST, Saifun, IMEC) the new high performance RIFLE-SE system has been developed for the testing of single cell, stand alone or embedded avant-garde non volatile memories (NAND/NOR standard flash, multilevel, dual bit, PCM).
RIFLE-SE has a completely new architecture that improves both digital and analog performances by a 10x factor and adds new important features to expand its application area considerably diminishing the measurement times.
The Rife-SE has an improved user interface, completely graphic, where complex analysis can be carried out and displayed with just few mouse clicks.

RifleSE
RIFLE has been developed for deep investigation of the behaviour and reliability of non-volatile memory cells and arrays.
Its easy-to-use and easy-to-program interface, together with a dedicated high performance measurement engine, enables its application in a wide range of operations, during technology and product development and during the life-time of the memory devices.

tech_produc_dev
Cell Level Reliability Studies
  • Cell level measurements and characterization (IV, Vt)
  • Single cell cycling
  • Algorithm trials (pulse waveforms, lengths, …)
Matrix Level Reliability Studies
  • Matrix level measurements and characterization (distributions, maps, subset identifications)
  • Full or partial matrix cycling
  • Algorithm trials (program and erase, simulating P/E controller)
Product Debug
  • Functional verification (matrix + interface)
  • Product characterization (distributions, maps, subset identifications)
  • Full or partial matrix cycling using embedded controller
Product Qualification
  • Failure analysis
  • Interactive investigations

manuf_product
Process Control
  • Functional and reliability analysis on test structures
  • Matrix level measurements and characterization (distributions, maps, subset identifications)
  • Full or partial matrix cycling
Product Quality Control
  • Functional and reliability analysis on products
  • Product characterization (distributions, maps, subset identifications)
  • Full or partial matrix cycling using embedded controller
Failure Analysis
  • Understanding failures coming from the testing or from Quality Control
  • Interactive investigations
Field Return Analysis
  • Understanding failures coming from field applications
  • Interactive investigations
LIST